Standard Test Data Format
- Standard Test Data Format
Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but now widely used de facto throughout the semiconductor industry. It is a commonly used format produced by Automatic Test Equipment (ATE) platforms from leading companies such as Teradyne, Verigy, LTX, Credence and others. STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ascii text is non trivial as it involves a detailed comprehension of the Standard Test Data Format (STDF) specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing statistical analysis on a population of tested devices.
External links
Specification
* [http://etidweb.tamu.edu/cdrom0/image/stdf/spec.pdf STDF version 4]
* [http://casey.marshall.googlepages.com/stdfv4-spec.pdf STDF version 4]
Standards Organizations
* [http://stdf.bcsweb.com/index.php/Main_Page STDF Group]
* [http://grouper.ieee.org/groups/ttsg/ IEEE Test Technology Standards Group/Committee]
* [http://www.semitest.org/ Semiconductor Test Consortium]
Information
* [http://mrhackerott.org/semiconductor-informatics/ Semiconductor Informatics]
* [http://code.google.com/p/pystdf/ Python module to process STDF files]
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