Friction force microscope


Friction force microscope

A friction force microscope is an atomic force microscope with a four quadrant photodetector, which allows measuring the frictional force acting on the probing tip sliding on a surface from the torsion of the cantilever beam where the tip is attached. Also called Lateral Force Microscopy (LFM). When the tip is modified to bear chemical functionality, chemical force (e.g. hydrophilic - hydrophobic interaction] operates between the tip and sample. Such mode of operation is called chemical force microscopy (CFM).

External links

* [http://www.nano-world.org/frictionmodule/content/0300reibungsmikroskopie/?lang=en "Friction Force Microscopy"]


Wikimedia Foundation. 2010.

Look at other dictionaries:

  • Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …   Wikipedia

  • Atomic force microscope — Microscope à force atomique Pour les articles homonymes, voir AFM et Microscope. Le premier microscope à force ato …   Wikipédia en Français

  • Microscope a force atomique — Microscope à force atomique Pour les articles homonymes, voir AFM et Microscope. Le premier microscope à force ato …   Wikipédia en Français

  • Microscope À Force Atomique — Pour les articles homonymes, voir AFM et Microscope. Le premier microscope à force ato …   Wikipédia en Français

  • Friction — For other uses, see Friction (disambiguation). Classical mechanics …   Wikipedia

  • Microscope à force atomique — Pour les articles homonymes, voir AFM, Microscope (homonymie) et Microscopie. Le premier microscope à force atomique du monde, au musée de …   Wikipédia en Français

  • Friction stir welding — (FSW) is a solid state joining process (meaning the metal is not melted during the process) and is used for applications where the original metal characteristics must remain unchanged as far as possible. This process is primarily used on aluminum …   Wikipedia

  • Microscopie à force atomique — Microscope à force atomique Pour les articles homonymes, voir AFM et Microscope. Le premier microscope à force ato …   Wikipédia en Français

  • Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …   Wikipedia

  • Stick-slip phenomenon — Stick slip (or slip stick ) refers to the phenomenon of a spontaneous jerking motion that can occur while two objects are sliding over each other. Cause Stick slip is caused by the surfaces alternatingly between a sticking to each other and… …   Wikipedia


Share the article and excerpts

Direct link
Do a right-click on the link above
and select “Copy Link”

We are using cookies for the best presentation of our site. Continuing to use this site, you agree with this.